Segmentation and classification of four common cotton contaminants in x-ray microtomographic images

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5303, Issue , 2004, Pages 1-13

  Pavani, Sri Kaushik ^a   Dogan, Mehmet S ^a   Sari Sarraf, Hamed ^a   Hequet, Eric F ^b  

^a Texas Tech University   (United States)

^b TEXAS TECH UNIVERSITY   (United States)

Author keywords

Background normalization; Computer vision; Cotton contamination; Delaunay triangulation; Fuzzy logic; X ray tomography

Indexed keywords

CONTAMINATION; COTTON; FUZZY SETS; IMAGE ANALYSIS; IMAGE SEGMENTATION; OPTIMIZATION; RELIABILITY; X RAY APPARATUS;

BACKGROUND NORMALIZATION; COTTON CONTAMINATION; DELAUNAY TRIANGULATION; X-RAY MICROTOMOGRAPHY;

COMPUTER VISION;

COTTON; FUZZY LOGIC; IMAGE ANALYSIS; OPTIMIZATION; POLLUTION; RELIABILITY; SEGMENTATION; VISION;

EID: 8844269436     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.527117     Document Type: Conference Paper

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