Visibility of noise in natural images

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5292, Issue , 2004, Pages 121-129

  Winkler, Stefan ^a   Süsstrunk, Sabine ^a  

^a EPFL   (Switzerland)

Author keywords

Noise masking; Noise sensitivity; Pattern masking; Quality metrics; Texture masking; Watermarking

Indexed keywords

ENTROPY; FILTRATION; IMAGE ANALYSIS; IMAGE COMPRESSION; MATHEMATICAL MODELS; WATERMARKING; WHITE NOISE;

NOISE MASKING; NOISE SENSITIVITY; PATTERN MASKING; TEXTURE MASKING;

ACOUSTIC NOISE;

EID: 8844265188     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.526752     Document Type: Conference Paper

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