Diffractive second-line security features for optically variable devices

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5310, Issue , 2004, Pages 289-298

  Schilling, Andreas ^a   Tompkin, Wayne R ^a   Staub, Rene ^a  

^a OVD Kinegram Corporation   (Switzerland)

Author keywords

Diffractive microstructures; High resolution; Moire; Polarization; Second line security features

Indexed keywords

DIFFRACTIVE OPTICS; LIGHT POLARIZATION; MICROLENSES; MICROSTRUCTURE; SPECTROSCOPIC ANALYSIS;

MAGNETIC PARTICLES; POLARIZATION EFFECTS; SECOND-LINE SECURITY FEATURES;

OPTICAL DEVICES;

EID: 8844249231     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.527686     Document Type: Conference Paper

References (7)

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3. I. Amidor, The Theory of the Moire Phenomenon; Kluwer Academic Publishers, 2000.
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5. S. Spannenburg, "Digital Copying Security Elements", in Optical Document Security; R. van Renesse, ed. Artech House Publishers, London, 1998, Chapter 8.
6. R. Staub, W. Tompkin, "Self-referencing diffractive features for OVD's", SPIE Vol. 3973, pp. 216-223, 2000.
7. H. Kamal, R. Voelkel, J. Alda, "Properties of moire magnifiers", Opt.Eng., 37, pp. 3007-3014, 1998.