Studies on sensitivity, resolution, and Doppler broadening in gamma-ray imaging with pixellated semiconductor detectors

Nuclear Physics A

Volumn 746, Issue 1-4 SPEC.ISS., 2004, Pages 639-642

  Lee, J H ^a   Lee, C S ^a  

^a Chung Ang University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 8844229008     PISSN: 03759474     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nuclphysa.2004.09.100     Document Type: Article

References (6)

1. R.T. Todd et al. Nature 251 1974 132
2. B. Hubbard-Nelson et al. Nucl. Instr. and Meth. A 422 1999 647
3. J.Y. Moon and C.S. Lee, in this volume
4. R. Ribberfors et al. Phys. Rev. B 12 1975 2067
5. W.A. Reed et al. Phys. Rev. B 6 1972 4596
6. C.S. Lee et al., in April Meeting of the American Physical Society, April 2003, Philadelphia, USA