The influence of intralayer structural distortions on the electrical and magnetic properties of V1+xMo2-xS4 (0 ≤ x ≤ 2)

Journal of Materials Chemistry

Volumn 14, Issue 20, 2004, Pages 3051-3057

  Powell, Anthony V ^a   McDowall, Andrew ^a   Vaqueiro, Paz ^a   Smith, Ronald I ^b   Ohtani, Tsukio ^c   Okuya, Yoshihiro ^c  

^a HERIOT WATT UNIVERSITY   (United Kingdom)

^b RUTHERFORD APPLETON LABORATORY   (United Kingdom)

^c OKAYAMA UNIVERSITY OF SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC PROPERTIES; MAGNETIC PROPERTIES; NEUTRON DIFFRACTION; SQUIDS; STRUCTURE (COMPOSITION); THERMOGRAVIMETRIC ANALYSIS; X RAY POWDER DIFFRACTION;

ELECTRON DELOCALIZATION; MAGNETIC MEASUREMENTS; STRUCTURAL DISTORTIONS;

VANADIUM COMPOUNDS;

CATION; CHALCOGEN; METAL; MOLYBDENUM; SULFUR DERIVATIVE; VANADIUM DERIVATIVE;

ARTICLE; CHEMICAL ANALYSIS; CHEMICAL COMPOSITION; CHEMICAL STRUCTURE; CONFORMATIONAL TRANSITION; CRYSTALLIZATION; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; ELECTRON TRANSPORT; MAGNETISM; MEASUREMENT; NEUTRON DIFFRACTION; SEMICONDUCTOR; STRUCTURE ANALYSIS; SYNTHESIS; TECHNIQUE; THERMOGRAVIMETRY; X RAY POWDER DIFFRACTION;

EID: 8844219725     PISSN: 09599428     EISSN: None     Source Type: Journal    
DOI: 10.1039/b406812b     Document Type: Article

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