TexPat - A program for quantitative analysis of oblique texture electron diffraction patterns

Zeitschrift fur Kristallographie

Volumn 219, Issue 1, 2004, Pages 12-19

  Oleynikov, Peter ^a   Hovmöller, Sven ^a   Zou, Xiaodong ^a   Zhukhlistov, Anatoliy P ^b   Nickolsky, Maxim S ^b   Zvyagin, Boris B ^b  

^a STOCKHOLM UNIVERSITY   (Sweden)

^b INSTITUTE OF GEOLOGY OF ORE DEPOSITS   (Russian Federation)

Author keywords

Electron diffraction; Intensities extraction; Program TexPat; Texture patterns

Indexed keywords

ACCURACY; ALGORITHM; ANALYTIC METHOD; ARTICLE; AUTOMATION; CALCULATION; CELLULAR PARAMETERS; COMPUTER PROGRAM; ELECTRON DIFFRACTION; EXTRACTION; QUANTITATIVE ANALYSIS; SURFACE PROPERTY; TEXTURE PATTERN;

EID: 8744309843     PISSN: 00442968     EISSN: None     Source Type: Journal    
DOI: 10.1524/zkri.219.1.12.25394     Document Type: Article

References (9)

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