Study of the electrochemical performance of sputtered Si 1-xSnx films

Journal of the Electrochemical Society

Volumn 151, Issue 10, 2004, Pages

  Hatchard, T D ^a   Dahn, J R ^a  

^a DALHOUSIE UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COMMINUTION; CORRELATION METHODS; CRACK INITIATION; CRYSTALLINE MATERIALS; ELECTRODES; LITHIUM; MAGNETRONS; SPUTTERING; VOLUMETRIC ANALYSIS;

ALUMINIUM ATOM; COMPOSITION ANALYSIS; CYCLIC VOLTAMMOGRAMS; LITHIUM ION BATTERIES;

ELECTROCHEMISTRY;

EID: 8744300871     PISSN: 00134651     EISSN: None     Source Type: Journal    
DOI: 10.1149/1.1790533     Document Type: Article

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