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Volumn 202, Issue 1, 2005, Pages 134-149

Sine-fit procedure for unevenly sampled, multiply clocked signals

Author keywords

[No Author keywords available]

Indexed keywords

SPECTRAL DENSITY;

EID: 8744280183     PISSN: 00219991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcp.2004.07.005     Document Type: Article
Times cited : (6)

References (17)
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    • Time-base nonlinearity determination using iterated sine-fit analysis
    • G.N. Stenbakken J.P. Deyst Time-base nonlinearity determination using iterated sine-fit analysis IEEE Trans. Instrum. Meas. IM-47 1998 1056
    • (1998) IEEE Trans. Instrum. Meas. , vol.IM-47 , pp. 1056
    • Stenbakken, G.N.1    Deyst, J.P.2
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    • Further development and properties of the spectral analysis by least-squares
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    • Scargle, J.D.1
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    • Best least-squares representation of signals by exponentials
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    • (1968) IEEE Trans. Aut. Cont. , vol.AC-13 , pp. 408
    • McDonough, R.N.1    Huggins, W.H.2
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    • In practice we assume a white noise background. We also assume that any additional noise, like the ADC quantization noise is also uncorrelated, and that its statistical distribution is well approximated by a Gaussian distribution
    • In practice we assume a white noise background. We also assume that any additional noise, like the ADC quantization noise is also uncorrelated, and that its statistical distribution is well approximated by a Gaussian distribution.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.