Using scattering parameters to characterize EMI filters

PESC Record - IEEE Annual Power Electronics Specialists Conference

Volumn 1, Issue , 2004, Pages 297-303

  Wang, Shuo ^a   Lee, F C ^a   Odendaal, W G ^a  

^a Virginia Polytechnic Institute and State University   (United States)

Author keywords

Common mode; Current bias; Differential mode; EMI filters; Insertion loss; Insertion voltage gain; Scattering parameters; Signal flow graph; Spectrum

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC FILTERS; ELECTRIC IMPEDANCE; ELECTRIC POTENTIAL; ELECTROMAGNETIC WAVE SCATTERING; INSERTION LOSSES; MATRIX ALGEBRA; SIGNAL INTERFERENCE; SIGNAL PROCESSING;

COMMON MODES; CURRENT BIAS; DIFFERENTIAL MODES; ELECTROMAGNETIC INTERFERENCE (EMI) FILTERS; INSERTION VOLTAGE GAIN; SIGNAL FLOW GRAPHS;

SCATTERING PARAMETERS;

EID: 8744270250     PISSN: 02759306     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (8)

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3. "Agilent AN 154 S-Parameters Design Application Note," Agilent Technologies, 2000.
4. Shuo Wang, F.C. Lee and W.G. Odendaal,"Improving the Performance of Boost PFC EMI Filters," In proc. IEEE Applied Power Electronics Conference and Exposition, Miami, FL, 9-13 Feb. 2003, pp. 368-374.
5. Norman Balabanian and Theodore Bickart,"Linear Network Theory: Analysis, Properties, Design and Synthesis," Matrix Publishers, Inc., 1981.
6. Shuo Wang, F.C Lee, D.Y. Chen and W.G. Odendaal,"Effects of Parasitic Parameters on the Performance of EMI Filters," In proc. IEEE Power Electronics Specialist Conference, Acapulco, Mexico, 15-19 Jun. 2003, pp.73-78.
7. Zhang, Dongbing, D.Y. Chen, M.J Nave and D. Sable,"Measurement of Noise Source Impedance of Off-line Converters," IEEE Transactions, Power Electronics, Volume 15, Issue 5, Sept. 2000, pp. 820-825
8. Max W.Medley,"Microwave and RF Circuits: Analysis, Synthesis, and Design," Artech House, Inc., 1993