Multiple window and cluster size scan procedures

Methodology and Computing in Applied Probability

Volumn 6, Issue 4, 2004, Pages 389-400

  Naus, Joseph I ^a   Wallenstein, Sylvan ^b  

^a RUTGERS UNIVERSITY   (United States)

^b MOUNT SINAI SCHOOL OF MEDICINE   (United States)

Author keywords

Clusters; k th order gaps; Nearest neighbor distances; Scan statistics; Spacings

Indexed keywords

EID: 8744265587     PISSN: 13875841     EISSN: None     Source Type: Journal    
DOI: 10.1023/B:MCAP.0000045087.33227.8c     Document Type: Article

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