Test bench for the characterisation of experimental low voltage IGCTs

PESC Record - IEEE Annual Power Electronics Specialists Conference

Volumn 4, Issue , 2004, Pages 2937-2942

  Ladoux, P ^a   Blaquiere, J M ^a   Alvarez, S ^b   Carroll, E ^c   Streit, P ^c  

^a CNRS   (France)

^b CIDAE ^*  (Spain)

^c ABB SWITZERLAND LTD   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

BENCH COMPONENTS; EXTRAPOLATION METHODS; JUNCTION TEMPERATURE; PASSIVE COMPONENTS;

CAPACITORS; CONTROL SYSTEMS; COOLING SYSTEMS; DIODES; PULSE WIDTH MODULATION; SEMICONDUCTOR MATERIALS; SWITCHING;

ELECTRIC POTENTIAL;

EID: 8744259678     PISSN: 02759306     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PESC.2004.1355301     Document Type: Conference Paper

References (6)

1. LEMSYS, "The Power Semiconductors Test Equipment Company", http://www.lemsys.com/index.html
2. J. von Bloh, R.W. De Doncker, "Characterizing Medium-Voltage High-Power Devices under Conventional and Soft-Switching Conditions", C. Proc. of the 34. Annual Meeting of the IEEE Industry Application Society (IAS), Phoenix (Arizona), 1999
3. H.A. Mantooth, A.R. Hefner, "Electro-thermal Simulation of an IGBT PWM Inverter", IEEE Trans. On Power Electronics. Vol 12, n°3, pp 474-484. May 1997
4. C. Turpin, F. Richardeau, T. Meynard, F. Forest, "Evaluation of High Power Converters by the Opposition Method", EPE Journal. Vol. 12 n°1. February 2002.
5. A.J. Brown, P.H. Mellor, D.A. Stone, "Calorimetric Measurements of Losses in IGBTs and MOSFETs in Hard Switched and Resonant Power Converters", PCIM 1996, Nuremberg.
6. S. Alvarez, P. Ladoux, J.M. Blaquiere, E. Carroll, P. Streit, "Characterisation of Low Voltage IGCTs (3.3kV) by using an Opposition Method test bench", PCIM 2004, Nuremberg