New laboratory experiments in analog electronics courses using microcomputer-based instrumentation and LabVIEW

ASEE Annual Conference Proceedings

Volumn , Issue , 1996, Pages 2425-2429

  Papannareddy, Rajappa ^a  

^a PURDUE UNIVERSITY CALUMET   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIER CIRCUITS; ANALOG ELECTRONICS COURSES; CIRCUIT SIMULATION; MICROCOMPUTER-BASED INSTRUMENTATION;

AMPLIFIERS (ELECTRONIC); COMPUTER SIMULATION; COMPUTER WORKSTATIONS; CURRICULA; DATA ACQUISITION; ENGINEERING EDUCATION; INSTRUMENT CIRCUITS; MICROCOMPUTERS;

ANALOG COMPUTERS;

EID: 8744256578     PISSN: 01901052     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. M. G. Guvench, "SPICE parameter extraction from automated measurement of JFET and MOSFET characteristics in the computer integrated electronics laboratory," Proceedings of ASEE Conference, pp. 879-884, 1994.
2. C. A. Harrison, "Automated laboratory workstations for network and control systems experiments," Proceedings of ASEE Conference, Toledo, Vol. 2, pp. 1143-1146, 1992.
3. J.M. Yarbrough, "Computer-aided analog analysis laboratory, "Proceedings of ASEE Conference, Vol. 1, pp. 571-575, 1990.
4. J. A. Stine et al., "A test and measurement system for electrical engineering education," Frontiers in Education Conference, Purdue University, West Lafayette, pp. 375-380, 1991.
5. G. W. Johnson, Lab VIEW Graphical Programming Techniques, McGraw-Hill, New York, 1994.
6. M. G. Guvench, "Automated measurement of semiconductor device characteristics for computer-assisted electronic design," Proceedings of ASEE Conference, Vol. 1, pp. 671-675, 1993.
7. D.A. Johnson and M. G. Thompson, "Shedding light on black boxes: undergraduate semiconductor characterization," Proceedings of ASEE Conference, Vol. 1, pp. 565-569, 1994.