Interfacial stresses in viscoelastic thin layer due to moisture absorption

Key Engineering Materials

Volumn 270-273, Issue I, 2004, Pages 843-848

  Lee, Sang Soon ^a   Kim, Nohyu ^a  

^a Korea University of Technology and Education   (South Korea)

Author keywords

Boundary element method; Interface stress; Moisture; Stress singularity; Stress singularity factor; Thin film; Viscoelastic

Indexed keywords

ABSORPTION; BOUNDARY ELEMENT METHOD; INTERFACES (MATERIALS); MATHEMATICAL MODELS; MOISTURE; THIN FILMS; TIME DOMAIN ANALYSIS; VISCOELASTICITY;

INTERFACE STRESS; MOISTURE ACBSORPTION; STRESS SINGULARITY; STRESS SINGULARITY FACTOR;

STRESS ANALYSIS;

EID: 8644290780     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/kem.270-273.843     Document Type: Conference Paper

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