High-resolution transmission electron microscopy studies of planar defects in the magnetic superconductor RuSr 2EuCu 2O 8

Applied Physics Letters

Volumn 85, Issue 15, 2004, Pages 3217-3219

  Vasiliev, A L ^a   Aindow, M ^a   Man, Z H ^a   Budnick, J I ^a   Hines, W A ^a   Klamut, P W ^b   Maxwell, M ^b   Dabrowski, B ^b  

^a UNIVERSITY OF CONNECTICUT   (United States)

^b NORTHERN ILLINOIS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC MODELS; MAGNETIC SUPERCONDUCTORS; PLANAR DEFECTS; RESERVOIR PLANES;

COMPUTER SIMULATION; CRYSTALLOGRAPHY; HIGH RESOLUTION ELECTRON MICROSCOPY; SENSITIVITY ANALYSIS; SUPERCONDUCTING MATERIALS; TRANSMISSION ELECTRON MICROSCOPY;

RUTHENIUM COMPOUNDS;

EID: 8644273294     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1805176     Document Type: Article

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