Optical properties of PLZT thin films fabricated by a sol-gel method

Key Engineering Materials

Volumn 269, Issue , 2004, Pages 65-68

  Ishii, Masatoshi ^a   Satoh, Keisuke ^a   Kato, Masayuki ^a   Kurihara, Kazuaki ^a  

^a FUJITSU LABORATORIES LTD   (Japan)

Author keywords

Birefringence; Electro optic coefficient; Epitaxial; PLZT; Refractive index; Sol gel method; Thin film

Indexed keywords

CRYSTAL STRUCTURE; CRYSTALLIZATION; ELECTRIC FIELDS; ELECTRIC POTENTIAL; NITROGEN; OPTICAL PROPERTIES; POLARIZATION; REFRACTIVE INDEX; SCHEMATIC DIAGRAMS; SILICON; SOL-GELS; WAVEGUIDES; X RAY DIFFRACTION;

ELECTRO-OPTIC COEFFICIENT; MORPHOTROPIC PHASE BOUNDARY (MPB); PLZT; PRISM COUPLING METHODS;

THIN FILMS;

EID: 8644270549     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

References (8)

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