X-ray diffraction contrast of screw dislocations in 6H-SiC single crystals and its computer processing

Poverkhnost Rentgenovskie Sinkhronnye i Nejtronnye Issledovaniya

Volumn , Issue 9, 2004, Pages 58-63

  Okunev, A O ^a   Tkal', V A ^a   Drozdov, Yu A ^a   Danil'chuk, L N ^a  

^a NONE

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EID: 8644252707     PISSN: 02073528     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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