Luminescence-based characterization of protective oxides: From failure mechanisms to non-destructive evaluation

Materials Science Forum

Volumn 461-464, Issue II, 2004, Pages 621-630

  Clarke, D R ^a   Tolpygo, V K ^a   Gentleman, M ^a  

^a University of California   (United States)

Author keywords

Failure; Luminescence; Non destructive evaluation; Oxidation; Piezospectroscopy; Spallation

Indexed keywords

ALUMINA; ANISOTROPY; CORRELATION METHODS; CRYSTAL STRUCTURE; FRACTURE MECHANICS; IMPURITIES; MICROSTRUCTURE; OXIDATION; OXIDES; SEMICONDUCTOR MATERIALS; THERMAL BARRIER COATINGS;

LUMINESCENCE SENSOR; NON-DESTRUCTIVE EVALUATION; PIEZOSPECTROSCOPY; SEMICONDUCTOR LUMINESCENCE; SPALLATION FAILURE;

LUMINESCENCE;

EID: 8644250450     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.461-464.621     Document Type: Conference Paper

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