Composition dependence of lead-free ferroelectric Ba(Ti, Zr)O3 thin films fabricated by chemical solution deposition process

Key Engineering Materials

Volumn 269, Issue , 2004, Pages 57-60

  Tanaka, Kiyotaka ^a   Suzuki, Kazuyuki ^a   Fu, Desheng ^a   Nishizawa, Kaori ^a   Miki, Takeshi ^a   Kato, Kazumi ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Ba(Ti, zr)O3; Chemical solution deposition process; Ferroelectrics; Lead free; Thin film

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; CRYSTALLIZATION; DEPOSITION; ELECTRIC PROPERTIES; ELECTRODES; LATTICE CONSTANTS; MICROSTRUCTURE; PEROVSKITE; PHASE TRANSITIONS; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

BA(TI,ZR)O3; CHEMICAL SOLUTION DEPOSITION PROCESS; LEAD-FREE; OXIDE FILMS;

FERROELECTRIC THIN FILMS;

EID: 8644249027     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

References (5)

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5. D. Hennings, A. Schenell and G. Simon: J. Am. Ceram. Soc., 65 (1982) 539.