Design of an undergraduate atomic force microscopy laboratory for a materials science lecture course

ASEE Annual Conference Proceedings

Volumn , Issue , 1999, Pages 1569-1574

  Hawkins, Michael A ^a   Lord, Susan M ^a  

^a UNIVERSITY OF SAN DIEGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATERIAL CHARCATERIZATION; MODERN TOOL; NATIONAL SCIENCE FOUNDATION (NSF); OPTOELECTRONICS LABORATORY;

ATOMIC FORCE MICROSCOPY; COST EFFECTIVENESS; DNA; ELECTRICAL ENGINEERING; ENGINEERING EDUCATION; ENGINEERING RESEARCH; ENGINEERS; INTEGRATED CIRCUITS; RESEARCH LABORATORIES; STRUCTURAL DESIGN; STUDENTS;

MATERIALS SCIENCE;

EID: 8644248262     PISSN: 01901052     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (6)

1. H. Kumar Wickramasinghe, "Scanned-Probe Microscopes", Scientific American, 261, 99 (1989).
2. Robert Pool, "The Children of the STM", Science, 247, 634 (1990).
3. For example, the Metris-2000 by Burleigh Instruments, Inc.
4. For example see J. Amato, Colgate University NSF Grant DUE 9650115, L. Lyons, Grinnell College, DUE 9452127, J. Drucker, University of Texas at El Paso NSF Grant DMR 9724305, D. Schaefer, Towson State, DUE 9851238, and M. Walczak, St. Olaf DUE 9552159
5. NSF Career Grant ECS-9796220 & NSF Instrumentation & Laboratory Improvement (ILI) Grant DUE-9796201
6. © Burleigh Instruments, Inc. 1996.