Kink effect in short-channel polycrystalline silicon thin-film transistors

Applied Physics Letters

Volumn 85, Issue 15, 2004, Pages 3113-3115

  Valletta, A ^a   Gaucci, P ^a   Mariucci, L ^a   Fortunato, G ^a   Brotherton, S D ^b  

^a IFN CNR   (Italy)

^b PHILIPS RESEARCH LABORATORIES   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

BIPOLAR TRANSISTORS; COMPUTATIONAL GEOMETRY; COMPUTER SIMULATION; ELECTRIC FIELDS; IONIZATION; SILICON ON INSULATOR TECHNOLOGY; THIN FILM TRANSISTORS; THRESHOLD VOLTAGE;

IONIZATION RATE; KINK EFFECT; PARASITIC BIPOLAR TRANSISTOR (PBT); PARASITIC RESISTANCE EFFECTS;

POLYSILICON;

EID: 8644246756     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1806252     Document Type: Article

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