Specificity of electron impact ionization in superstructure silicon carbide

Materials Science Forum

Volumn 457-460, Issue I, 2004, Pages 661-664

  Sankin, V I ^a   Shkrebiy, P P ^a   Savkina, N S ^a   Lepneva, A A ^a  

^a IOFFE INSTITUTE   (Russian Federation)

Author keywords

Electrical field; Field induced localisation; Impact ionisation; Miniband, bragg reflection; Natural superlattice; Silicon carbide; Wannier stark localization

Indexed keywords

ELECTRIC BREAKDOWN; ELECTRIC FIELDS; HEATING; IMPACT IONIZATION; LIGHT REFLECTION; SUPERLATTICES;

BRAGG REFLECTION; FIELD INDUCED LOCALIZATION; MINIBANDS; NATURAL SUPERLATTICES; WANNIER-STARK LOCALIZATION;

SILICON CARBIDE;

EID: 8644244730     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.457-460.661     Document Type: Conference Paper

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