A novel reflective FT-IR microscopy method

Spectroscopy (Santa Monica)

Volumn 12, Issue 5, 1997, Pages 42-44

  Rafferty, Denise Wade ^a   Craig Virnelson, R ^a  

^a NONE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 8644225292     PISSN: 08876703     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (3)

1. J. Cohen and R. Virnelson, FT-1R Spectrometer Window and Method, U.S. Patent #5,160,826,1992.
2. R. Dirkx, M.H. Gitlitz, and D.A. Russo, Chemtech, 552,1992.
3. W.G. Golden, in Fourier Transform Infrared Spectroscopy, Vol. 4 (Academic Press, San Diego, CA, 1985).