Development and characterization of a flat-panel detector-based microtomography system

Key Engineering Materials

Volumn 270-273, Issue I, 2004, Pages 245-251

  Lee, Sang Chul ^a   Kim, Ho Kyung ^b   Chun, In Kon ^a   Cho, Myung Hye ^a   Cho, Min Hyoung ^a   Lee, Soo Yeol ^a  

^a Kyung Hee University   (South Korea)

^b Pusan National University   (South Korea)

Author keywords

3 D Imaging; CMOS; Flat panel Detector; Microtomography

Indexed keywords

BIOMEDICAL ENGINEERING; CMOS INTEGRATED CIRCUITS; IMAGE RECONSTRUCTION; NONDESTRUCTIVE EXAMINATION; PHOSPHORS; PRINTED CIRCUIT BOARDS; SIGNAL TO NOISE RATIO; X RAYS;

FLAT-PANEL DETECTORS; MICROTOMOGRAPHY SYSTEMS; X-RAY DETECTORS; X-RAY PROJECTION SYSTEMS;

MEDICAL IMAGING;

EID: 8644221302     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/kem.270-273.245     Document Type: Conference Paper

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