Catching up faster in Bayesian model selection and model averaging

Advances in Neural Information Processing Systems 20 - Proceedings of the 2007 Conference

Volumn , Issue , 2008, Pages

  Van Erven, Tim ^a   Grünwald, Peter ^a   De Rooij, Steven ^a  

^a CWI   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

STATISTICAL METHODS;

BAYESIAN METHODS; BAYESIAN MODEL AVERAGING; BAYESIAN MODEL SELECTION; CATCHING-UP; CROSS VALIDATION; LEAVE ONE OUT; MODEL AVERAGING; MODEL SELECTION; RATE OF CONVERGENCE; SLOW CONVERGENCES;

BAYESIAN NETWORKS;

EID: 85162072440     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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