Sub-nanostrain strain measurements using a pi-phase shifted grating

Optics InfoBase Conference Papers

Volumn , Issue , 1997, Pages 28-30

  LeBlanc, Michel ^a   Kersey, Alan D ^a   Tsai, Tsung Ein ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85136370070     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (2)

1. Agrawal and S. Radic, IEEE Phot. Techn. Lett., v6 n8 (Aug, 1994): pp. 995-997
2. J. Canning and M.G. Sceats, Electronics Lett.: v30 n16 (Aug 4, 1994): pp. 1344-1345.