Exploring the Crystalline Microstructure of Thin Films Using a Series of Lanthanide Trifluorides as a Probe

Optics InfoBase Conference Papers

Volumn , Issue , 2001, Pages

  Lingg, L J ^a   Macleod, H A ^a  

^a UNIVERSITY OF ARIZONA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; FUSED SILICA; MICROSTRUCTURE; PROBES; THERMAL EVAPORATION; THIN FILMS;

FUSED SILICA SUBSTRATES; QUENCHING TIME; SINGLE LAYER; THIN-FILMS; TRIFLUORIDES;

RARE EARTH ELEMENTS;

EID: 85135890359     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. L. J. Lingg is now with Spectra Physics Lasers, 1330 Terra Bella Ave, Mountain View, CA 94306.
2. H. A. Macleod is now with Thin Film Center, 2745 East Via Rotunda, Tucson, AZ 85716.
3. Lingg, L. J., PhD Dissertation, University of Arizona, 1990.
4. Klinger, R. E. and C. K. Carniglia, Applied Optics, vol. 24, pp.3184-3187, 1985.
5. Targove, J. D., PhD Dissertation, University of Arizona, 1987.
6. Sachtler, W. M. H., et al, “Alloy Phases in Cu-Ni films Experimental Results and Thermodynamic Calculations,” in Int'l. Symposium on Basic Problems in Thin Film Physics, R. Neidermeyer and H. Mayer, eds., Gottingen, 1966,p.218.
7. Macleod, H. A., Optical Coatings: Design through Manufacture, Class Notes, 1999.