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Volumn 1999-W, Issue , 1999, Pages 209-213

EXTENSIVE EXPERIMENTAL STUDY ON DIAPHRAGM-BASED PIEZOELECTRIC MICROPHONE

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRESS; DIAPHRAGMS; II-VI SEMICONDUCTORS; PIEZOELECTRICITY; RESIDUAL STRESSES; SILICON NITRIDE; ZINC OXIDE;

EID: 85120007669     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/IMECE1999-0269     Document Type: Conference Paper
Times cited : (2)

References (12)
  • 2
    • 84941427276 scopus 로고
    • IC-processed Piezoelectric Microphone
    • Kim, E. S., and Muller, R. S., 1987, “IC-processed Piezoelectric Microphone,” IEEE Electron Devices Letter, vol. EDL-8, pp. 467-468.
    • (1987) IEEE Electron Devices Letter , vol.EDL-8 , pp. 467-468
    • Kim, E. S.1    Muller, R. S.2
  • 4
    • 0031257342 scopus 로고    scopus 로고
    • A Silicon Condenser Microphone with Polyimide Diaphragm and Backplate
    • Pedersen, M., Olthuis, W., and Bergveld, P., 1997, “A Silicon Condenser Microphone with Polyimide Diaphragm and Backplate,” Sensors and Actuators A, vol. A-63, pp. 97-104.
    • (1997) Sensors and Actuators A , vol.A-63 , pp. 97-104
    • Pedersen, M.1    Olthuis, W.2    Bergveld, P.3
  • 8
    • 0020203162 scopus 로고
    • Silicon Nitride Single-layer X-ray Mask
    • Sekimoto, M., Yoshihara, H., and Ohkubo, T., 1982, “Silicon Nitride Single-layer X-ray Mask,” J. Vac. Sci. Technol., Vol. 21, pp. 1017-1021.
    • (1982) J. Vac. Sci. Technol , vol.21 , pp. 1017-1021
    • Sekimoto, M.1    Yoshihara, H.2    Ohkubo, T.3
  • 9
    • 0032291692 scopus 로고    scopus 로고
    • Test Methods for Characterizing Piezoelectric Thin Films
    • in Microelectromechnical Structures for Materials Research, S. Brown, et al., ed
    • von Preissig, F. J., Zeng, H., and Kim, E. S., 1998a, “Test Methods for Characterizing Piezoelectric Thin Films,” in MRS Proceeding, vol. 518, Microelectromechnical Structures for Materials Research, S. Brown, et al., ed., pp. 117-122.
    • (1998) MRS Proceeding , vol.518 , pp. 117-122
    • von Preissig, F. J.1    Zeng, H.2    Kim, E. S.3
  • 10
    • 0032097444 scopus 로고    scopus 로고
    • Measurement of Piezoelectric Strength in ZnO Thin Films for MEMS Applications
    • von Preissig, F. J., Zeng, H., and Kim, E. S., 1998b, “Measurement of Piezoelectric Strength in ZnO Thin Films for MEMS Applications,” Journal of Smart Materials and Structures, vol. 1, pp. 396-403.
    • (1998) Journal of Smart Materials and Structures , vol.1 , pp. 396-403
    • von Preissig, F. J.1    Zeng, H.2    Kim, E. S.3
  • 12
    • 0030244813 scopus 로고    scopus 로고
    • Design and Fabrication of Silicon Condenser Microphone Using Corrugated Diaphragm Technique
    • Zou, Q., Li, Z., and Liu, L., 1996, “Design and Fabrication of Silicon Condenser Microphone Using Corrugated Diaphragm Technique,” J. Microelectromechanical System, vol. 5, pp. 197-204.
    • (1996) J. Microelectromechanical System , vol.5 , pp. 197-204
    • Zou, Q.1    Li, Z.2    Liu, L.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.