A new method for characterization of natural zeolites and organic nanostructure using atomic force microscopy

Nanomaterials

Volumn 2, Issue 1, 2012, Pages 79-91

  Fuoco, Domenico ^a,b  

^a Italian National Board of Chemists and Italian Chemical Society   (Italy)

^b NONE   (Canada)

Author keywords

Atomic force microscopy (AFM); Cetyltriammonium bromide (CTAB); Microtopography; Scanning electron microscopy (SEM); Zeolites

Indexed keywords

EID: 85115802463     PISSN: None     EISSN: 20794991     Source Type: Journal    
DOI: 10.3390/nano2010079     Document Type: Article

References (22)

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