Design and Analysis of Accelerated Tests for Mission Critical Reliability

Design and Analysis of Accelerated Tests for Mission Critical Reliability

Volumn , Issue , 2004, Pages 1-231

  LuValle, Michael J ^a   Lefevre, Bruce G ^b   Kannan, SriRaman ^c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF FLORIDA   (United States)

^c NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85114965715     PISSN: None     EISSN: None     Source Type: Book    
DOI: None     Document Type: Book

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