An integrated multi-domain analysis environment for high consequence systems

Proceedings of the ASME Design Engineering Technical Conference

Volumn 6, Issue , 1998, Pages

  Davis, James ^a   Scott, Jason ^a   Sztipanovits, Janos ^a   Karsai, Gabor ^a   Martinez, Marcus ^b  

^a VANDERBILT UNIVERSITY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINARY DECISION DIAGRAMS; FAULT TREE ANALYSIS; INTEGRATED CONTROL; RELIABILITY ANALYSIS; SAFETY ENGINEERING;

FINITE STATE MACHINE MODEL; HIGH ASSURANCE SYSTEMS; HIGH-CONSEQUENCE SYSTEM; INTEGRATED APPROACH; MULTIGRAPH ARCHITECTURE; ORDERED BINARY DECISION DIAGRAMS; RELIABILITY INFORMATION; SYMBOLIC MODEL CHECKING;

MODEL CHECKING;

EID: 85100933288     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/DETC98/CIE-5532     Document Type: Conference Paper

References (14)

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