Fabrication and structure characterization of molecular deposition films

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4086, Issue , 2000, Pages 721-724

  Wang, Qiangbin ^a   Gu, Hongchen ^a   Gao, Manglai ^b   Zhang, Siwei ^b  

^a EAST CHINA UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b CHINA UNIVERSITY OF PETROLEUM   (China)

Author keywords

Ab initial calculation; Atomic force microscope; Molecular deposition film; Structure characteristics; X photoelectron spectroscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; FABRICATION; GOLD DEPOSITS; GOLD METALLOGRAPHY; MOLECULAR ORBITALS; MONOLAYERS; TOPOGRAPHY; ULTRATHIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

ANIONIC COMPOUNDS; DEPOSITING PROCESS; ELECTROSTATIC ATTRACTIONS; ELEMENT CONTENTS; MOLECULAR DEPOSITION; MOLECULAR DEPOSITION FILM; OPPOSITE CHARGE; STRUCTURE CHARACTERIZATION;

DEPOSITION;

EID: 85089084899     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.408363     Document Type: Conference Paper

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