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Volumn , Issue , 2002, Pages

A sensitivity-based commonality strategy for family products of mild variation, with application to automotive body structures

Author keywords

[No Author keywords available]

Indexed keywords

SENSITIVITY ANALYSIS;

EID: 85088760799     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.2514/6.2002-5610     Document Type: Conference Paper
Times cited : (30)

References (14)
  • 5
    • 70449655509 scopus 로고    scopus 로고
    • Effective Product Family Design Using Physical Programming and the Product Platform Concept Exploration Method
    • paper DAC-14252, Baltimore, MD
    • Messac A., Martinez M.P., and Simpson T.W., 2000, "Effective Product Family Design Using Physical Programming and the Product Platform Concept Exploration Method," Proceedings of the 2000 ASME Design Engineering Technical Conferences, paper DAC-14252, Baltimore, MD.
    • (2000) Proceedings of the 2000 ASME Design Engineering Technical Conferences
    • Messac, A.1    Martinez, M.P.2    Simpson, T.W.3
  • 9
    • 0013035705 scopus 로고    scopus 로고
    • Product Variety Optimization: Simultaneous Optimization of Module Combination and Module Attributes
    • paper DAC-21058, Pittsburgh, PA
    • Fujita K., and Yoshida H., 2001, "Product Variety Optimization: Simultaneous Optimization of Module Combination and Module Attributes," Proceedings of the 2001 ASME Design Engineering Technical Conferences, paper DAC-21058, Pittsburgh, PA.
    • (2001) Proceedings of the 2001 ASME Design Engineering Technical Conferences
    • Fujita, K.1    Yoshida, H.2
  • 10
    • 0042812735 scopus 로고    scopus 로고
    • On the Applicability of Product Variety Design Concepts to Automotive Platform Commonality
    • Paper No. 98-DETC/DTM-5661, Atlanta, GA
    • Siddique Z., Rosen D.W, and Wang N., 1998, "On the Applicability of Product Variety Design Concepts to Automotive Platform Commonality," ASME Design Engineering Technical Conferences, Paper No. 98-DETC/DTM-5661, Atlanta, GA.
    • (1998) ASME Design Engineering Technical Conferences
    • Siddique, Z.1    Rosen, D.W.2    Wang, N.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.