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Volumn 62, Issue 6, 1996, Pages 575-579

Vertical ordering of islands in Ge-Si multilayers

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[No Author keywords available]

Indexed keywords


EID: 85088224527     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/bf01571696     Document Type: Article
Times cited : (3)

References (19)
  • 1
    • 5944251842 scopus 로고
    • Properties of Silicon Germanium
    • INSPEC The Institution of Electrical Engineers, London
    • E. Kasper (ed.): Properties of Silicon Germanium. EMIS Data Rev. Ser., No. 12 (INSPEC The Institution of Electrical Engineers, London 1995)
    • (1995) EMIS Data Rev. Ser. , vol.12
    • Kasper, E.1
  • 9
    • 0000240718 scopus 로고
    • USA
    • M. A. Grinfeld: Sov. Phys.-Dokl. (USA) 31, 831 (1986) D. J. Srolovitz: Acta Met. 37, 621 (1989) M. A. Grinfeld, D. J. Srolovitz: in Silicon Germanium ed. by E. Kasper, EMIS Data Rev. Ser., , No. 12 (INSPEC The Institution of Electrical Engineers, London 1995) p, 53
    • (1986) Sov. Phys.-Dokl. , vol.31 , pp. 831
    • Grinfeld, M.A.1
  • 10
    • 0024611337 scopus 로고
    • M. A. Grinfeld: Sov. Phys.-Dokl. (USA) 31, 831 (1986) D. J. Srolovitz: Acta Met. 37, 621 (1989) M. A. Grinfeld, D. J. Srolovitz: in Silicon Germanium ed. by E. Kasper, EMIS Data Rev. Ser., , No. 12 (INSPEC The Institution of Electrical Engineers, London 1995) p, 53
    • (1989) Acta Met. , vol.37 , pp. 621
    • Srolovitz, D.J.1
  • 11
    • 5944225622 scopus 로고
    • INSPEC The Institution of Electrical Engineers, London
    • M. A. Grinfeld: Sov. Phys.-Dokl. (USA) 31, 831 (1986) D. J. Srolovitz: Acta Met. 37, 621 (1989) M. A. Grinfeld, D. J. Srolovitz: in Silicon Germanium ed. by E. Kasper, EMIS Data Rev. Ser., , No. 12 (INSPEC The Institution of Electrical Engineers, London 1995) p, 53
    • (1995) Silicon Germanium Ed. by E. Kasper, EMIS Data Rev. Ser. , vol.12 , pp. 53
    • Grinfeld, M.A.1    Srolovitz, D.J.2
  • 16
    • 0001248641 scopus 로고    scopus 로고
    • R. D. Mindlin, D. H. Cheng: J. Appl. Phys. 21, 926 (1950) ibid 931; for review see T. Mura: Micromechanics of Defects in Solids (Nijhoff, The Hague 1982)
    • (1950) J. Appl. Phys. , vol.21 , pp. 926
    • Mindlin, R.D.1    Cheng, D.H.2
  • 17
    • 0001248641 scopus 로고    scopus 로고
    • R. D. Mindlin, D. H. Cheng: J. Appl. Phys. 21, 926 (1950) ibid 931; for review see T. Mura: Micromechanics of Defects in Solids (Nijhoff, The Hague 1982)
    • J. Appl. Phys. , pp. 931
  • 18
    • 0001248641 scopus 로고    scopus 로고
    • Nijhoff, The Hague
    • R. D. Mindlin, D. H. Cheng: J. Appl. Phys. 21, 926 (1950) ibid 931; for review see T. Mura: Micromechanics of Defects in Solids (Nijhoff, The Hague 1982)
    • (1982) Micromechanics of Defects in Solids
    • Mura, T.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.