|
|
Volumn 19, Issue 6, 2003, Pages 2532-
|
|
Erratum: Voltammetric characterization of ruthenium oxide-based aerogels and other RuO2 solids: The nature of capacitance in nanostructured materials (Langmuir (1999) 15 (780-785))
[No Author Info available]
|
|
Author keywords
[No Author keywords available]
|
|
Indexed keywords
|
|
EID: 85087597994
PISSN: 07437463
EISSN: None
Source Type: Journal
DOI: 10.1021/la0209536 Document Type: Erratum |
|
Times cited : (3)
|
|
References (0)
|