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Volumn , Issue , 2010, Pages
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A global measure for depth of investigation
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Author keywords
[No Author keywords available]
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Indexed keywords
GEOPHYSICS;
DEPTH OF INVESTIGATION;
GEOPHYSICAL MODELING;
GEOPHYSICAL SURVEYS;
RESISTIVITY STRUCTURE;
SENSITIVITY LIMIT;
SENSITIVITY MATRIX;
THRESHOLD LIMITS;
THRESHOLD-VALUE;
JACOBIAN MATRICES;
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EID: 85087596759
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.3997/2214-4609.20144778 Document Type: Conference Paper |
Times cited : (4)
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References (7)
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