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Volumn , Issue 168, 1996, Pages
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Dealing with large EMC uncertainties
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTROMAGNETIC COMPATIBILITY;
EQUIPMENT TESTING;
ERROR ANALYSIS;
PROBABILITY;
STANDARDS;
ELECTROMAGNETIC COMPATIBILITY UNCERTAINTIES;
MEASUREMENT ERRORS;
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EID: 85087575668
PISSN: 09633308
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1049/ic:19960969 Document Type: Conference Paper |
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Times cited : (3)
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References (5)
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