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Volumn 80, Issue 23, 2002, Pages 51-
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Taking a measure of chiral righes
[No Author Info available]
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 85086684675
PISSN: 00092347
EISSN: None
Source Type: Trade Journal
DOI: 10.1021/cen-v080n023.p051 Document Type: Review |
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Times cited : (6)
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References (0)
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