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Volumn 433-436, Issue , 2003, Pages
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Materials Science Forum
[No Author Info available]
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Author keywords
[No Author keywords available]
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Indexed keywords
CHEMICAL VAPOR DEPOSITION;
COMPUTER SIMULATION;
CRUCIBLES;
CRYSTAL DEFECTS;
DEEP LEVEL TRANSIENT SPECTROSCOPY;
DOPING (ADDITIVES);
EPITAXIAL GROWTH;
MESFET DEVICES;
MORPHOLOGY;
MOS DEVICES;
PARAMAGNETIC RESONANCE;
POLYCRYSTALLINE MATERIALS;
SECONDARY ION MASS SPECTROMETRY;
SINGLE CRYSTALS;
SYNCHROTRON RADIATION;
X RAY ANALYSIS;
BULK GROWTH;
EIREV;
MICROPIPES;
MONOCRYSTALS;
PHYSICAL VAPOR TRANSPORT (PVT) TECHNIQUES;
SEMI-INSULATING MATERIALS;
SILICON CARBIDE;
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EID: 85086642020
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: None Document Type: Conference Review |
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Times cited : (7)
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References (0)
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