Optical filters with constant optical thickness and refined refractive indices

Optics InfoBase Conference Papers

Volumn , Issue , 2007, Pages

  Larouche, Stéphane ^a   Martinu, Ludvik ^a  

^a ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

COATINGS; FIBER OPTIC SENSORS; LIGHT INTERFERENCE;

OPTICAL THICKNESS;

REFRACTIVE INDEX;

EID: 85086614876     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: 10.1364/oic.2007.tud8     Document Type: Conference Paper

References (4)

1. A. Thelen, "Design of optical minus filters," J. Opt. Soc. Am. 61, 365-369 (1971).
2. Y. Wada, N. Toyohara, Y. Shinta, S. Iura, K. Takahashi, and K. Kawamata, "Design of minus filters using arbitrary refractive index films," in Optical Interference Coatings on CD-ROM (The Optical Society of America, Washington, DC, 2004), TuB5.
3. C. J. v. d. Laan and H. J. Frankena, "Fast computation method for derivatives of multilayer stack reflectance," Appl. Opt. 17, 538-541 (1978).
4. S. Larouche, H. Szymanowski, J. E. Klemberg-Sapieha, L. Martinu, and S. C. Gujrathi, "Microstructure of plasma-deposited SiO2/TiO2 optical films," J. Vac. Sci. Technol. A 22, 1200-1207 (2004).