Tritium retention in S-65 beryllium after 100 eV plasma exposure

Journal of Nuclear Materials

Volumn 241-243, Issue , 1997, Pages 1041-1046

  Causey, Rion A ^a   Longhurst, Glen R ^b   Harbin, Wally ^c  

^a SANDIA NATIONAL LABORATORIES   (United States)

^b IDAHO NATIONAL LABORATORY   (United States)

^c LOS ALAMOS NATIONAL LABORATORY   (United States)

Author keywords

Low Z material; Plasma wall interaction simulator; Tritium inventory and economy; Wall particle retention

Indexed keywords

EID: 85086527221     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0022-3115(97)80190-0     Document Type: Article

References (7)

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2. M.I. Baskes, DIFFUSE 83, SAND83-8231.
3. R.A. Anderl, M.R. Hankins, O.R. Longhurst, R.J. Pawelko and R.G. Macaulay-Newcombe. Hydrogen Transport Behavior of Beryllium, EGG-M-92096.
4. M.I. Guseva, A.Yu. Birukov, V.M. Gureev et al., Proc. 2nd IEA Int. Workshop on Beryllium Technology for Fusion, Jackson Lake Lodge, Wyoming (1995) p. 315.
5. V.N. Chernikov, V.Kh. Alimov and A.P. Zakharov, Proc. 2nd IEA Int. Workshop on Beryllium Technology for Fusion, Jackson Lake Lodge, Wyoming (1995) p. 294.
6. G.R. Longhurst et al., EGG-FSP-10315, Idaho National Engineering Laboratory (June 1992).
7. R.A. Causey, W.L. Hsu, B.E. Mills et al., J. Nucl. Mater. 176-177 (1990) 654.