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Volumn , Issue , 2005, Pages
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Experimental investigation of MPI tolerances of modulation formats and consequences for Raman amplification
a
SIEMENS AG
(Germany)
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Author keywords
[No Author keywords available]
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Indexed keywords
OPTICAL SWITCHES;
AMPLIFIED SPONTANEOUS EMISSIONS;
DESIGN RULES;
EXPERIMENTAL INVESTIGATIONS;
MODULATION FORMATS;
MULTIPLE-PATH;
RAMAN AMPLIFICATION;
MODULATION;
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EID: 85086491552
PISSN: None
EISSN: 21622701
Source Type: Conference Proceeding
DOI: 10.1364/oaa.2005.md3 Document Type: Conference Paper |
Times cited : (1)
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References (3)
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