Diffusion model comparisons for direct reentry applications

36th AIAA Thermophysics Conference

Volumn , Issue , 2003, Pages

  Gosse, Ryan ^a   Candler, Graham ^a  

^a UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85085403842     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.2514/6.2003-3635     Document Type: Conference Paper

References (0)