Objective measurement of scratch and dig

Optics InfoBase Conference Papers

Volumn , Issue , 2012, Pages

  Aikens, David M ^a  

^a Savvy Optics Corp   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPONENT SPECIFICATION; NATIONAL STANDARD; OBJECTIVE MEASUREMENT; SURFACE IMPERFECTIONS;

SPECIFICATIONS;

EID: 85083317932     PISSN: None     EISSN: 21622701     Source Type: Conference Proceeding    
DOI: 10.1364/oft.2012.otu2d.5     Document Type: Conference Paper

References (6)

1. D. Aikens, "The truth about scratch and dig", Optical Fabrication and Testing, OSA p)TuA2 (2010).
2. ANSI/OEOSC OP1.002-2009, "American National Standard For Optics and Electro-Optical Instruments-Optical Elements and Assemblies-Appearance Imperfections." American National Standards Institute, Inc. (2009).
3. L. Baker, Metrics for High-Quality Specular Surfaces Vol. TT65 (2004), pp. 47-69
4. Q. Turchette, and T. Turner, "Developing a more useful surface quality metric for laser optics", Proc SPIE Vol 7912 (2011).
5. Photo courtesy of Customised Techologies, (P) Ltd. http://www.customisedtechnologies.com/homepage.htm
6. I. T. Lewis, et al., "Stray-light implications of scratch/dig specifications", Proc. SPIE Vol 1530, pp 22-34 (1991).