Fatigue testing and analysis

Fatigue Testing and Analysis

Volumn , Issue , 2005, Pages

  Lee, Yung Li ^a   Pan, Jwo ^b   Hathaway, Richard ^c   Barkey, Mark ^d  

^a CENTRO RICERCHE FIAT   (Italy)

^b UNIVERSITY OF MICHIGAN   (United States)

^c WESTERN MICHIGAN UNIVERSITY   (United States)

^d UNIVERSITY OF ALABAMA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 85081485856     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1016/B978-0-7506-7719-6.X5000-3     Document Type: Book

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