Met rology for spatial interferornetry II

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2477, Issue , 1995, Pages 240-258

  Gürsel, Yekta ^a  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISTANCE MEASUREMENT; GAGES; INTERFEROMETERS; LOCKS (FASTENERS); ORBITS; OVENS; TIME MEASUREMENT;

ABSOLUTE CALIBRATION; ABSOLUTE DISTANCE; ABSOLUTE DISTANCE MEASUREMENT; ABSOLUTE METROLOGY; CAVITY TEMPERATURE; SPATIAL INTERFEROMETERS; STELLAR INTERFEROMETERS; VERY HIGH RESOLUTION;

INTERFEROMETRY;

EID: 85076783332     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.212997.full     Document Type: Conference Paper

References (2)

1. Y. Giirsel. Laser metrology gauges for OSI, in Proceedings of SPIE conference on Spacebome Interferometry, Vol. 1947, p. 188-197, 1993.
2. Y. Giirsel. Metrology for spatial interferometry, in Proceedings of SPIE conference on Amplitude and Intensity Spatial Interferometry, Vol. 2200, p. 27-34, 1994.