Methods for CCD camera characterization

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 2173, Issue , 1994, Pages 73-84

  Mullikin, J C ^a,b   Van Vliet, L J ^a   Netten, H ^a   Boddeke, F R ^a   Van Der Feltz, G ^a   Young, I T ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DYES; FREQUENCY RESPONSE; IMAGE ACQUISITION; IMAGING SYSTEMS; SIGNAL TO NOISE RATIO;

CAMERA CHARACTERIZATION; PHILIPS; PHOTOMETRICS; SPATIAL FREQUENCY RESPONSE; THOMPSON;

CCD CAMERAS;

EID: 85076710012     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.175165     Document Type: Conference Paper

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