Microelectronics and photonics test bed (mptb)

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 1953, Issue , 1993, Pages 2-6

  Ritter, James C ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; DIGITAL DEVICES; EQUIPMENT TESTING; FORECASTING; MICROELECTRONICS; ORBITS; RADIATION HARDENING;

ANALOG TO DIGITAL CONVERTERS; MICRO-ELECTRONIC DEVICES; OPERATIONAL MISSION; OPERATIONAL SPACECRAFT; SINGLE EVENT UPSET CROSS SECTIONS; SPACE ENVIRONMENT; SPACE RADIATION ENVIRONMENT; TESTING PROTOCOLS;

PHOTONICS;

EID: 85076046199     PISSN: 0277786X     EISSN: 1996756X     Source Type: Conference Proceeding    
DOI: 10.1117/12.156572     Document Type: Conference Paper

References (0)