Novel microstructure quantification framework for databasing, visualization, and analysis of microstructure data

Integrating Materials and Manufacturing Innovation

Volumn 2, Issue 1, 2013, Pages 54-80

  Niezgoda, Stephen R ^a,b   Kanjarla, Anand K ^c   Kalidindi, Surya R ^d  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b Ohio State University   (United States)

^c INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

^d GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Microstructure; Two point correlations; Microstructure database; Structure property relationships; Reduced order models

Indexed keywords

DATA VISUALIZATION; RANDOM PROCESSES; STOCHASTIC SYSTEMS; VISUALIZATION;

COMPLEX MICROSTRUCTURES; MATERIALS SCIENCE AND ENGINEERING; MICROSTRUCTURE PROPERTIES; NATURAL ENVIRONMENTS; PROCESS REPRESENTATION; QUANTITATIVE COMPARISON; REDUCED ORDER MODELS; SYSTEMATIC FRAMEWORK;

MICROSTRUCTURE;

EID: 85075456680     PISSN: 21939764     EISSN: 21939772     Source Type: Journal    
DOI: 10.1186/2193-9772-2-3     Document Type: Article

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