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Volumn , Issue , 2002, Pages

An integrated system life cycle-based risk management methodology

Author keywords

[No Author keywords available]

Indexed keywords

COPYRIGHTS; COST ENGINEERING; ENVIRONMENTAL TECHNOLOGY; INFORMATION MANAGEMENT; LIFE CYCLE; SYSTEMS ENGINEERING;

EID: 85072474576     PISSN: 01487191     EISSN: 26883627     Source Type: Journal    
DOI: 10.4271/2002-01-0145     Document Type: Conference Paper
Times cited : (1)

References (21)
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    • 85072460714 scopus 로고    scopus 로고
    • Objective Detection Ranking Guidelines for Performing Process Failure Mode and Effect Analysis
    • SAE, Inc. Warrendale, PA
    • Baurer, Dan, "Objective Detection Ranking Guidelines for Performing Process Failure Mode and Effect Analysis" (SAE paper 1999-01-1625), Automotive Electronics Reliability, 2000. SAE, Inc., Warrendale, PA; pp. 397-399.
    • (2000) (SAE Paper 1999-01-1625), Automotive Electronics Reliability , pp. 397-399
    • Baurer, D.1
  • 3
    • 78149444767 scopus 로고
    • Chrysler, Ford, General Motors. Automotive Industry Action Group (AIAG), Southfield, MI
    • Chrysler, Ford, General Motors. Advanced Product Quality Planning (APQP). Automotive Industry Action Group (AIAG), 1995: Southfield, MI.
    • (1995) Advanced Product Quality Planning (APQP)
  • 4
    • 0012040050 scopus 로고
    • Chrysler, Ford, General Motors. Automotive Industry Action Group (AIAG), Southfield, MI
    • Chrysler, Ford, General Motors. Potential Failure Mode and Effects Analysis. Automotive Industry Action Group (AIAG), 1995: Southfield, MI.
    • (1995) Potential Failure Mode and Effects Analysis
  • 5
    • 0012909115 scopus 로고
    • Chrysler, Ford, General Motors. Automotive Industry Action Group (AIAG), Southfield, MI
    • Chrysler, Ford, General Motors. Production Part Approval Process (PPAP). Automotive Industry Action Group (AIAG), 1995: Southfield, MI.
    • (1995) Production Part Approval Process (PPAP)
  • 6
    • 84877538109 scopus 로고    scopus 로고
    • SM - SE/SW, V1.0: Capability Maturity Model - Integrated for Systems Engineering/Software Engineering, Version 1.0
    • CMMI Product Development Team, Carnegie Mellon University, Aug
    • SM-SE/SW, V1.0: Capability Maturity Model-Integrated for Systems Engineering/Software Engineering, Version 1.0" Carnegie Mellon Software Engineering Institute. Carnegie Mellon University, Aug 2000.
    • (2000) Carnegie Mellon Software Engineering Institute
  • 7
    • 84877565242 scopus 로고    scopus 로고
    • Engineering Materials and Standards
    • Ford Motor Company
    • Ford Motor Company. FMEA Handbook. Engineering Materials and Standards, 1997.
    • (1997) FMEA Handbook
  • 8
    • 84877526615 scopus 로고    scopus 로고
    • st Century Vehicles
    • SAE, Inc. Warrendale, PA
    • st Century Vehicles," Automotive Electronics Reliability, 2000. SAE, Inc., Warrendale, PA; pp. 513-529.
    • (2000) Automotive Electronics Reliability , pp. 513-529
    • Frank, R.1
  • 14
    • 85072475841 scopus 로고    scopus 로고
    • Failure Mode & Effects Analysis in Software Development
    • SAE, Inc. Warrendale, PA
    • Pries, Kim H., "Failure Mode & Effects Analysis in Software Development" (SAE paper 982816), Automotive Electronics Reliability, 2000. SAE, Inc., Warrendale, PA pp. 351-361.
    • (2000) (SAE Paper 982816), Automotive Electronics Reliability , pp. 351-361
    • Pries, K.H.1
  • 16
    • 84877524741 scopus 로고    scopus 로고
    • SAE Electronics Reliability Subcommittee. SAE, Inc. Warrendale, PA
    • SAE Electronics Reliability Subcommittee. SAE Automotive Electronics Reliability Handbook, AE-9. SAE, Inc., Warrendale, PA., p. 365.
    • SAE Automotive Electronics Reliability Handbook, AE-9 , pp. 365
  • 18
    • 84877553148 scopus 로고    scopus 로고
    • Structured FMEA - A New Proposal for Failure Mode and Effect Analysis
    • SAE, Inc. Warrendale, PA
    • Sampaio, Paulo S., "Structured FMEA-A New Proposal for Failure Mode and Effect Analysis" (SAE paper 921533), Automotive Electronics Reliability, 2000. SAE, Inc., Warrendale, PA; pp. 401-404.
    • (2000) (SAE Paper 921533), Automotive Electronics Reliability , pp. 401-404
    • Sampaio, P.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.