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Volumn , Issue , 1997, Pages
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Implementation of subsystem reliability growth testing on a purpose built electric vehicle
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Author keywords
[No Author keywords available]
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Indexed keywords
AUTOMOTIVE INDUSTRY;
DEFECTS;
PRODUCT DESIGN;
VEHICLES;
ECONOMIC PRESSURES;
ELECTRICAL SUBSYSTEMS;
ITERATIVE PROCESS;
MANUFACTURING PROCESS;
NEW TECHNOLOGIES;
RELIABILITY GROWTH;
RELIABILITY PARAMETERS;
VEHICLE DEVELOPMENT;
RELIABILITY;
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EID: 85072467315
PISSN: 01487191
EISSN: 26883627
Source Type: Journal
DOI: 10.4271/970082 Document Type: Conference Paper |
Times cited : (1)
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References (3)
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